MICROSCOPY

LABORATORY 

LOCATION

TECHNICAL STAFF

EQUIPMENTS

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FORMS

TECHNICAL STAFF

MOHD FERDAUS BIN MD NOR

SCIENCE OFFICER (CA41)
Phone No: 03-2203 1527
Room No: K.X.01.01.31.01
Email: m.ferdaus@utm.my

SKILLS
  • Attend training in electron and optical microscope instruments

RESEARCH / SERVICE EXPERIENCE

MOHAMMAD TAUFIK BIN MOHD SAAD

ASSISTANT ENGINEER (J29)
Phone No: 03-2203 1527
Room No:  K.X.01.01.31.01
Email: taufik.kl@utm.my

SKILLS
  • Attend training in electron and  optical microscope instruments
RESEARCH / SERVICE EXPERIENCE

ZAIM BIN MUHAMAD RADZI

ASSISTANT ENGINEER (J29)
Phone No: 03-2203 1527
Room No:  K.X.01.01.31.01
Email: zaimradzi@utm.my

SKILLS
  • Attend training in electron and  optical microscope instruments
RESEARCH / SERVICE EXPERIENCE

JUFA ZYHA BINTI MD SALLEH

ASSISTANT SCIENCE OFFICER (CA29)
Phone No: 03-2203 1527
Room No:  K.X.01.01.31.01
Email: jufazyha@utm.my

SKILLS
  • Attend training in electron and  optical microscope instruments
RESEARCH / SERVICE EXPERIENCE

FADHILAL HAZIM BIN FAKHRURADZI

ASSISTANT LABORATORY (CA19)
Phone No: 03-2203 1527
Room No:  K.X.01.01.31.01
Email: fadhilalhazim@utm.my

SKILLS
  • Attend training in electron and  optical microscope instruments
RESEARCH / SERVICE EXPERIENCE

EQUIPMENTS

FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPE (FETEM)

Brand: JEOL

Model: JEM-2100F

Function:

  • Ultrahigh resolution in scanning transmission microscopy and nano-scaled sample. 
  • Simplifies atomic level structural analyses in biology, medicine, and materials sciences.
  • Provide ease of use tilt, rotation, heating and cooling, as well as programmable multi-point settings.
  • Able to equip with STEM, MDS, EDS, and CCD-cameras.

DUALBEAM SCANNING ELECTRON MICROSCOPE/FOCUSED ION BEAM (FIB-SEM)

Brand: FEI

Model: HELIOS NANOLAB G3 UC

Function: 

  • Reveal the finest nanoscale details in 2D and 3D images with clearest contrast.
  • Prepare the thinnest and highest quality samples to access the most accurate atomic information.
  • For a wide range of materials including metals, polymers, nanotubes, particles of ceramics.

FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)

Brand: JEOL

Model: JSM-7800F

Function: 

  • Observe the finest structural   morphology of nano-materials at 1,000,000X magnification.
  • Collect large area EBSD maps at low magnifications
  • Perform low kV imaging and analysis of highly magnetic samples and image.

LOW VACUUM SCANNING ELECTRON MICROSCOPE (LV-SEM)

Brand: JEOL

Model: JSM-IT300

Function: 

  • High resolution of 3.0nm at 30kV and unsurpassed low kV performance.
  • Deliver amazing clarity for imaging the finest structures.
  • High resolution across the magnification range of 5X – 300,000X.

3D MEASURING LASER MICROSCOPE

Brand: OLYMPUS

Model: LEXT OLS4100

Function:

  • To perform non-contact 3D measurement of complex surface.
  • Guarantees both repeatability and accuracy.
  • Obtain 3D images automatically and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

FLUORESCENCE MICROSCOPE

Brand: Olympus

Model: BX53

Function: 

  • To determine localization and distribution of small organisms.
  • Use to study ion concentrations and the process occurs inside or between the cells.

ATOMIC FORCE MICROSCOPY (AFM)

Brand: Bruker

Model: Multimode 8

Function :

  • For measuring the surface topography with high resolution.
  • Characterization of electrical, magnetic, and mechanical properties can be done into nanoscale level.

DIGITAL MICROSCOPE

Brand: OLYMPUS

Model: DSX510

Function: 

  • Provide observation, image capturing, measurement, and sharing.
  • Deliver efficient observation, intuitive magnifying operation, a variety of observation methods, and reproducibility.
  • Include EFI and 3D imaging, wide area image capturing, movie capturing, and programmed image capturing.

STEREO ZOOM MICROSCOPE

Brand : NIKON 

Model: SMZ745T

Function: 

  • Well suit for industrial and biomedical applications.
  • Produce brighter images with higher contrast.
  • Capable to use in environment where the temperature and humidity are high due to anti-mold design.

FORMS

Sample Analysis Application Form